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High Efficiency Planar Ge-on-Si Single-Photon Avalanche Diode Detectors

  • J. Kirdoda
  • , L. Ferre Llin
  • , K. Kuzmenko
  • , P. Vines
  • , Z. Greener
  • , D. C. S. Dumas
  • , R. W. Millar
  • , M. M. Mirza
  • , G. S. Buller
  • , D. J. Paul*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Abstract

Planar Ge-on-Si single-photon avalanche diode detectors fabricated using CMOS-compatible processing demonstrate a 38% single photon detection efficiency at 125 K with 1310 nm wavelength illumination, exhibiting 310 ps jitter and 2× 10-16 WHz-1/2noise equivalent power.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science 2019
PublisherOSA Publishing
ISBN (Electronic)9781943580576
DOIs
Publication statusPublished - 5 May 2019
EventCLEO: QELS Fundamental Science 2019 - San Jose, United States
Duration: 5 May 2019 → 10 May 2019

Conference

ConferenceCLEO: QELS Fundamental Science 2019
Country/TerritoryUnited States
CitySan Jose
Period5/05/19 → 10/05/19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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