| Original language | English |
|---|---|
| Pages (from-to) | 36-43 |
| Number of pages | 8 |
| Journal | Journal of Electron Microscopy |
| Volume | 45 |
| Publication status | Published - 1996 |
High angle dark field STEM for advanced materials
S J Pennycook, David Jesson, A J McGibbon, P D Nellist
Research output: Contribution to journal › Article › peer-review
65
Citations
(Scopus)