Original language | English |
---|---|
Pages (from-to) | 36-43 |
Number of pages | 8 |
Journal | Journal of Electron Microscopy |
Volume | 45 |
Publication status | Published - 1996 |
High angle dark field STEM for advanced materials
S J Pennycook, David Jesson, A J McGibbon, P D Nellist
Research output: Contribution to journal › Article › peer-review
64
Citations
(Scopus)