Abstract
An entirely digital method of TIADC error calibration is presented in this paper. The methodology is based on statistical properties of signals for error estimations particularly targeting mean and variance of samples. In the proposed algorithm offset mismatch can be corrected by subtracting the estimated offset from each sub-ADC digital samples. Similarly, gain mismatch can be corrected by multiplying the output of each sub-ADC by the inverse of its estimated gain and both of these corrections, offset and gain, are cost effective in terms of hardware.
Original language | English |
---|---|
Title of host publication | 2017 International SoC Design Conference (ISOCC) |
Publisher | IEEE |
ISBN (Electronic) | 9781538622858 |
DOIs | |
Publication status | Published - 31 May 2018 |
Event | 14th IEEE International SoC Design Conference 2017 - Seoul, Korea, Republic of Duration: 5 Nov 2017 → 8 Nov 2017 |
Conference
Conference | 14th IEEE International SoC Design Conference 2017 |
---|---|
Abbreviated title | ISOCC 2017 |
Country/Territory | Korea, Republic of |
City | Seoul |
Period | 5/11/17 → 8/11/17 |
Keywords
- TI ADC
- MATLAB
- FFT
- Offset Correction
- Gain Correction
ASJC Scopus subject areas
- Electrical and Electronic Engineering