Abstract
Zinc blende MgS has been grown on GaAs by molecular beam epitaxy using a novel method where the sources were Mg and ZnS. A reaction at the surface results in the formation of MgS layers with a Zn content estimated by secondary ion mass spectrometry and Auger spectroscopy to be between 0.5% and 2%. Double crystal x-ray rocking curve measurements of ZnSe/MgS/ZnSe layers show layers with good crystallinity. Using this growth technique layers up to 67 nm thick have been grown. Photoluminescence measurements of MgS/ZnSe/MgS single-quantum-well structures show that the confinement of the heavy hole excitons can be as large as 430 meV for a 1.7 nm well. © 2000 American Institute of Physics.
Original language | English |
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Pages (from-to) | 3929-3931 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 76 |
Issue number | 26 |
Publication status | Published - 26 Jun 2000 |