Generalized multi-frequency selection for full-field interferometric shape measurement

C. E. Towers, D. P. Towers, J. D C Jones

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We present two novel multi-frequency techniques for absolute range measurement in interferometry. A comparison of these techniques with the method of excess fractions has been performed by computer simulation and experimental data is presented.

Original languageEnglish
Pages (from-to)406-409
Number of pages4
JournalProceedings of SPIE - the International Society for Optical Engineering
Volume5502
DOIs
Publication statusPublished - 2004
EventSecond European Workshop on Optical Fibre Sensors, EWOFS'04 - Santander, Spain
Duration: 9 Jun 200411 Jun 2004

Keywords

  • Absolute phase measurement
  • Multi-frequency interferometry
  • Profilometry

Fingerprint Dive into the research topics of 'Generalized multi-frequency selection for full-field interferometric shape measurement'. Together they form a unique fingerprint.

Cite this