The precision and accuracy of profile measurement achieved by a point diffraction interferometer (PDI) is determined by a spherical diffraction reference wavefront whose quality is mainly controlled by the pinhole’s alignment. In consideration of a Gaussian beam incidence, different diffraction wavefront errors stemming from misalignment of pinhole including lateral shift, defocus, and tilt are analyzed with the help of a proposed systematic model and a new evaluation criterion established under spherical coordinates. The full-field distributions of various diffraction wavefront errors are obtained through simulation. The predicted accuracy of an actual PDI makes a good agreement with the experiment results. The achieved results will be beneficial to the accuracy evaluation of a PDI before and after its design.
|Number of pages||7|
|Early online date||3 Dec 2019|
|Publication status||Published - 1 Jan 2020|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering