The harsh operating environment of the automotive application makes the semi-permanent connector susceptible to intermittent high contact resistance which eventually leads to failure. Fretting corrosion is often the cause of these failures. However, laboratory testing of sample contact materials produces results that do not correlate with commercially tested connectors. A multicontact (M-C) reliability model is developed to bring together the fundamental studies and studies conducted on commercially available connector terminals. It is based on fundamental studies of the single contact interfaces and applied to commercial multicontact terminals. The model takes into consideration firstly, that a single contact interface may recover to low contact resistance after attaining a high value and secondly, that a terminal consists of more than one contact interface. For the connector to fail, all contact interfaces have to be in the failed state at the same time.
|Number of pages
|IEEE Transactions on Components and Packaging Technologies
|Published - Dec 2002