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Frequency Comb Metrology with a Near-Infrared Optical Parametric Oscillator

  • Karolis Balskus
  • , Stephane Schilt
  • , Valentin Wittwer
  • , Pierre Brochard
  • , Tobias Ploetzing
  • , Nayara Jornod
  • , Richard A. McCracken
  • , Zhaowei Zhang
  • , Albrecht Bartels
  • , Derryck T. Reid
  • , Thomas Südmeyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We show the first absolute optical frequency metrology demonstration performed with an OPO. The OPO frequency comb shows ~300-mrad integrated CEO phase noise and ~70-kHz optical linewidth at 1557-nm when fully-stabilized to a radio-frequency reference.
Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations 2016
PublisherOSA Publishing
ISBN (Print)9781943580118
DOIs
Publication statusPublished - 2016
EventCLEO: Science and Innovations 2016 - San Jose, California, San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

NameOSA Technical Digest
PublisherOptical Society of America

Conference

ConferenceCLEO: Science and Innovations 2016
Country/TerritoryUnited States
CitySan Jose
Period5/06/1610/06/16

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