Frequency Comb Metrology with a Near-Infrared Optical Parametric Oscillator

Karolis Balskus, Stephane Schilt, Valentin Wittwer, Pierre Brochard, Tobias Ploetzing, Nayara Jornod, Richard A. McCracken, Zhaowei Zhang, Albrecht Bartels, Derryck T. Reid, Thomas Südmeyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We show the first absolute optical frequency metrology demonstration performed with an OPO. The OPO frequency comb shows ~300-mrad integrated CEO phase noise and ~70-kHz optical linewidth at 1557-nm when fully-stabilized to a radio-frequency reference.
Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations 2016
PublisherOSA Publishing
ISBN (Print)9781943580118
Publication statusPublished - 2016
EventCLEO: Science and Innovations 2016 - San Jose, California, San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

NameOSA Technical Digest
PublisherOptical Society of America


ConferenceCLEO: Science and Innovations 2016
Country/TerritoryUnited States
CitySan Jose


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