Fault-tolerant characterization of phase objects using a speckle-based phase retrieval technique

A novel method for the characterization of phase-only objects using a polarimetric speckle-based phase retrieval technique is demonstrated experimentally. Phase errors stemming from the illumination beam curvature which appear as material defects are evaluated and corrected numerically. The retrieved phase maps are used in the comparison and recognition of test objects through a phase correlation technique. The proposed method offers enhanced discrimination capability in phase object recognition owing to the use of polarization information and affords a simple setup since no holographic reference beam is used. © Taylor & Francis Group, LLC.