Fastscan z-scan system for determining optical non-linearities in semiconductors

I. J. Blewett, J. Stokes, A. Tookey, A. K. Kar, B. S. Wherrett

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Abstract

Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)355-358
Number of pages4
JournalOptics and Laser Technology
Volume29
Issue number7
Publication statusPublished - Oct 1997

Keywords

  • Non-linear optics
  • z-scan
  • Zinc selenide

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    Blewett, I. J., Stokes, J., Tookey, A., Kar, A. K., & Wherrett, B. S. (1997). Fastscan z-scan system for determining optical non-linearities in semiconductors. Optics and Laser Technology, 29(7), 355-358.