Abstract
Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 355-358 |
| Number of pages | 4 |
| Journal | Optics and Laser Technology |
| Volume | 29 |
| Issue number | 7 |
| Publication status | Published - Oct 1997 |
Keywords
- Non-linear optics
- z-scan
- Zinc selenide
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Blewett, I. J., Stokes, J., Tookey, A., Kar, A. K., & Wherrett, B. S. (1997). Fastscan z-scan system for determining optical non-linearities in semiconductors. Optics and Laser Technology, 29(7), 355-358.