Fastscan z-scan system for determining optical non-linearities in semiconductors

I. J. Blewett; J. Stokes; A. Tookey; A. K. Kar; B. S. Wherrett

Fastscan z-scan system for determining optical non-linearities in semiconductors

I. J. Blewett, J. Stokes, A. Tookey, A. K. Kar, B. S. Wherrett

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.

Original language	English
Pages (from-to)	355-358
Number of pages	4
Journal	Optics and Laser Technology
Volume	29
Issue number	7
Publication status	Published - Oct 1997

Keywords

Non-linear optics
z-scan
Zinc selenide

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@article{edf04d827b8c4b9a9c6c8035c277cf68,

title = "Fastscan z-scan system for determining optical non-linearities in semiconductors",

abstract = "Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. {\textcopyright} 1998 Elsevier Science Ltd. All rights reserved.",

keywords = "Non-linear optics, z-scan, Zinc selenide",

author = "Blewett, {I. J.} and J. Stokes and A. Tookey and Kar, {A. K.} and Wherrett, {B. S.}",

year = "1997",

month = oct,

language = "English",

volume = "29",

pages = "355--358",

journal = "Optics and Laser Technology",

issn = "0030-3992",

publisher = "Elsevier Limited",

number = "7",

}

TY - JOUR

T1 - Fastscan z-scan system for determining optical non-linearities in semiconductors

AU - Blewett, I. J.

AU - Stokes, J.

AU - Tookey, A.

AU - Kar, A. K.

AU - Wherrett, B. S.

PY - 1997/10

Y1 - 1997/10

N2 - Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.

AB - Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.

KW - Non-linear optics

KW - z-scan

KW - Zinc selenide

UR - http://www.scopus.com/inward/record.url?scp=0031246865&partnerID=8YFLogxK

M3 - Article

VL - 29

SP - 355

EP - 358

JO - Optics and Laser Technology

JF - Optics and Laser Technology

SN - 0030-3992

IS - 7

ER -

Fastscan z-scan system for determining optical non-linearities in semiconductors

Abstract

Keywords

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