Fastscan z-scan system for determining optical non-linearities in semiconductors

I. J. Blewett, J. Stokes, A. Tookey, A. K. Kar, B. S. Wherrett

Research output: Contribution to journalArticle

Abstract

Traditional z-scan techniques have been used to determine the non-linear optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability. The technique is used here to study the two-photon absorption coefficient of ZnSe. © 1998 Elsevier Science Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)355-358
Number of pages4
JournalOptics and Laser Technology
Volume29
Issue number7
Publication statusPublished - Oct 1997

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nonlinearity
holders
absorptivity
scanning
photons
coefficients

Keywords

  • Non-linear optics
  • z-scan
  • Zinc selenide

Cite this

Blewett, I. J., Stokes, J., Tookey, A., Kar, A. K., & Wherrett, B. S. (1997). Fastscan z-scan system for determining optical non-linearities in semiconductors. Optics and Laser Technology, 29(7), 355-358.
Blewett, I. J. ; Stokes, J. ; Tookey, A. ; Kar, A. K. ; Wherrett, B. S. / Fastscan z-scan system for determining optical non-linearities in semiconductors. In: Optics and Laser Technology. 1997 ; Vol. 29, No. 7. pp. 355-358.
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Blewett, IJ, Stokes, J, Tookey, A, Kar, AK & Wherrett, BS 1997, 'Fastscan z-scan system for determining optical non-linearities in semiconductors', Optics and Laser Technology, vol. 29, no. 7, pp. 355-358.

Fastscan z-scan system for determining optical non-linearities in semiconductors. / Blewett, I. J.; Stokes, J.; Tookey, A.; Kar, A. K.; Wherrett, B. S.

In: Optics and Laser Technology, Vol. 29, No. 7, 10.1997, p. 355-358.

Research output: Contribution to journalArticle

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