| Original language | English |
|---|---|
| Pages (from-to) | 355-358 |
| Number of pages | 4 |
| Journal | Optics and Laser Technology |
| Volume | 29 |
| Publication status | Published - 1997 |
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Fast scan z-scan system for determining optical nonlinearities in semiconductors
- I J Blewett
- , J Stokes
- , A Tookey
- , Ajoy Kumar Kar
- , Brian Spencer Wherrett
Research output: Contribution to journal › Article › peer-review