Fast scan z-scan system for determining optical nonlinearities in semiconductors

I J Blewett, J Stokes, A Tookey, Ajoy Kumar Kar, Brian Spencer Wherrett

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)355-358
Number of pages4
JournalOptics and Laser Technology
Volume29
Publication statusPublished - 1997

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