Original language | English |
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Pages (from-to) | 355-358 |
Number of pages | 4 |
Journal | Optics and Laser Technology |
Volume | 29 |
Publication status | Published - 1997 |
Fast scan z-scan system for determining optical nonlinearities in semiconductors
I J Blewett, J Stokes, A Tookey, Ajoy Kumar Kar, Brian Spencer Wherrett
Research output: Contribution to journal › Article › peer-review