Extraction of Process-Structure Evolution Linkages from X-ray Scattering Measurements Using Dimensionality Reduction and Time Series Analysis

David B. Brough, Abhiram Kannan, Benjamin Haaland, David Bucknall, Surya R. Kalidindi

Research output: Contribution to journalArticle


The rapid development of robust, reliable, and reduced-order process-structure evolution linkages that take into account hierarchical structure are essential to expedite the development and manufacturing of new materials. Towards this end, this paper lays a theoretical framework that injects the established time series analysis into the recently developed materials knowledge systems (MKS) framework. This new framework is first presented and then demonstrated on an ensemble dataset obtained using small-angle X-ray scattering on semi-crystalline linear low density polyethylene films from a synchrotron X-ray scattering experiment.

Original languageEnglish
Pages (from-to)147-159
Number of pages13
JournalIntegrating Materials and Manufacturing Innovation
Issue number2
Early online date10 Mar 2017
Publication statusPublished - Jun 2017



  • Hierarchical materials
  • Materials knowledge systems
  • Microstructure evolution
  • Multiscale materials
  • Polyethylene
  • Process-structure linkage
  • PyMKS
  • SAXS
  • Time series

ASJC Scopus subject areas

  • Materials Science(all)
  • Industrial and Manufacturing Engineering

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