Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano- to the micro-scale

Neil M. Wight, Nick S. Bennett

Research output: Contribution to journal › Article › peer-review

53 Downloads (Pure)

Original language	English
Pages (from-to)	10211-10217
Journal	Materials Today: Proceedings
Volume	5
Issue number	4, Part 1
Early online date	22 May 2018
DOIs	https://doi.org/10.1016/j.matpr.2017.12.267
Publication status	E-pub ahead of print - 22 May 2018
Event	14th European Conference on Thermoelectrics 2016 - Lisbon, Portugal Duration: 20 Sept 2016 → 23 Sept 2016

Access to Document

Download pdf
© 2018 Elsevier B.V.
Accepted author manuscript, 250 KBLicence: CC BY-NC-ND

@article{01a8517f24ab4e7a9ed3e52688587fc6,

title = "Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano- to the micro-scale",

author = "Wight, {Neil M.} and Bennett, {Nick S.}",

year = "2018",

month = may,

day = "22",

doi = "10.1016/j.matpr.2017.12.267",

language = "English",

volume = "5",

pages = "10211--10217",

journal = "Materials Today: Proceedings",

issn = "2214-7853",

publisher = "Elsevier",

number = "4, Part 1",

note = "14th European Conference on Thermoelectrics 2016, ECT 2016 ; Conference date: 20-09-2016 Through 23-09-2016",

}

TY - JOUR

T1 - Experimental up-scaling of thermal conductivity reductions in silicon by vacancy-engineering: From the nano- to the micro-scale

AU - Wight, Neil M.

AU - Bennett, Nick S.

PY - 2018/5/22

Y1 - 2018/5/22

U2 - 10.1016/j.matpr.2017.12.267

DO - 10.1016/j.matpr.2017.12.267

M3 - Article

SN - 2214-7853

VL - 5

SP - 10211

EP - 10217

JO - Materials Today: Proceedings

JF - Materials Today: Proceedings

IS - 4, Part 1

T2 - 14th European Conference on Thermoelectrics 2016

Y2 - 20 September 2016 through 23 September 2016

ER -