Experimental measurement of switched reluctance motor non-linear characteristics

Zhengyu Lin, Donald S. Reay, Binxin Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

For a Switched Reluctance Motor (SRM), the flux linkage characteristic is the most basic magnetic characteristic, and many other quantities, including the incremental inductance, back emf, and electromagnetic torque can be determined indirectly from it. In this paper, two methods of measuring the flux linkage profile of an SRM from the phase winding voltage and current measurements, with and without rotor locking devices, are presented. Torque, incremental inductance and back emf characteristics of the SRM are then obtained from the flux linkage measurements. The torque of the SRM is also measured directly as a comparison, and the closeness of the calculated and directly measured torque curves suggests the validity of the method to obtain the SRM torque, incremental inductance and back emf profiles from the flux linkage measurements.

Original languageEnglish
Title of host publicationIECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE
Pages2827-2832
Number of pages6
ISBN (Print)978-1-4799-0224-8
DOIs
Publication statusPublished - 2013
Event39th Annual Conference of the IEEE Industrial Electronics Society - Vienna, Austria
Duration: 10 Nov 201314 Nov 2013

Conference

Conference39th Annual Conference of the IEEE Industrial Electronics Society
Abbreviated titleIECON 2013
CountryAustria
CityVienna
Period10/11/1314/11/13

Keywords

  • flux linkage
  • indrect measurement
  • non-linear characteristics
  • switched reluctance motor (SRM)

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Lin, Z., Reay, D. S., & Zhou, B. (2013). Experimental measurement of switched reluctance motor non-linear characteristics. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society (pp. 2827-2832). IEEE. https://doi.org/10.1109/IECON.2013.6699579