Exact run length distribution of the double sampling X chart with estimated process parameters

W. L. Teoh, M. S. Fun, S. Y. Teh, Michael Boon Chong Khoo, W. C. Yeong

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart’s performance. Thus it is important to investigate the entire run length distribution of a control chart for an in-depth understanding before implementing the chart in process monitoring. In this paper, the percentiles of the run length distribution for the double sampling (DS) chart with estimated process parameters are computed. Knowledge of the percentiles of the run length distribution provides a more comprehensive understanding of the expected behaviour of the run length. This additional information includes the early false alarm, the skewness of the run length distribution, and the median run length (MRL). A comparison of the run length distribution between the optimal ARL-based and MRL-based DS chart with estimated process parameters is presented in this paper. Examples of applications are given to aid practitioners to select the best design scheme of the DS chart with estimated process parameters, based on their specific purpose.

Original languageEnglish
Pages (from-to)20-31
Number of pages12
JournalSouth African Journal of Industrial Engineering
Volume27
Issue number1
DOIs
Publication statusPublished - May 2016

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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