Polarization analysis may improve the robustness of a depth imaging system as applied to metallic surfaces. However, particular difficulties remain when third or higher-order reflections occur. Although the geometry of the first reflection is predictable from the geometry of the system and the microfacet model, subsequent reflections can arise from several numbers and combinations of reflecting angles, and are variable to a greater extent dependent on the material property and finish.
|Journal||IEE Colloquium (Digest)|
|Publication status||Published - 1 Jan 1997|
|Event||Proceedings of the 1997 IEE Colloquium on Industrial Inspection - London, UK|
Duration: 10 Feb 1997 → 10 Feb 1997