Electrical characterization of zinc oxide thin films by electrochemical capacitance-voltage profiling

X. Tang, A. Clauzonnier, Heather Dalgarno, K. A. Prior, B. C. Cavenett

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@article{cce99d21557d413cae597c640878d789,

title = "Electrical characterization of zinc oxide thin films by electrochemical capacitance-voltage profiling",

author = "X. Tang and A. Clauzonnier and Heather Dalgarno and Prior, {K. A.} and Cavenett, {B. C.}",

year = "2004",

month = apr,

day = "19",

doi = "10.1063/1.1695442",

language = "English",

volume = "84",

pages = "3043--3045",

journal = "Applied Physics Letters",

issn = "1077-3118",

publisher = "American Institute of Physics Publising LLC",

number = "16",

}

TY - JOUR

T1 - Electrical characterization of zinc oxide thin films by electrochemical capacitance-voltage profiling

AU - Tang, X.

AU - Clauzonnier, A.

AU - Dalgarno, Heather

AU - Prior, K. A.

AU - Cavenett, B. C.

PY - 2004/4/19

Y1 - 2004/4/19

U2 - 10.1063/1.1695442

DO - 10.1063/1.1695442

M3 - Article

SN - 1077-3118

VL - 84

SP - 3043

EP - 3045

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

ER -