Efficient stochastic analysis of transmission signal integrity for remote sensing applications

Zhouxiang Fei, Yi Huang, Jiafeng Zhou, Chaoyun Song, Tianyuan Jia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a statistical evaluation of the transmission signal integrity at the intra-system level of remote sensing devices. The signal integrity is evaluated using the crosstalk induced to the signal. Due to the vague knowledge of the characteristics of the signal cable, the crosstalk becomes a random quantity and needs to be described using statistics. In this paper, the stochastic reduced order model (SROM) method is applied to obtain the statistics of crosstalk in the presence of the random cable configuration. By comparing to the Monte-Carlo method, it is found that the SROM method is much more efficient and accurate. Due to the generality of the SROM method, it may be inspiring to solve other stochastic electromagnetic compatibility problems of remote sensing devices.

Original languageEnglish
Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility
PublisherIEEE
Pages1132-1136
Number of pages5
ISBN (Electronic)9781509059973
DOIs
Publication statusPublished - 25 Jun 2018
Event60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility 2018 - Suntec City, Singapore
Duration: 14 May 201818 May 2018

Conference

Conference60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility 2018
Abbreviated titleEMC/APEMC 2018
Country/TerritorySingapore
CitySuntec City
Period14/05/1818/05/18

Keywords

  • Cable crosstalk
  • Electromagnetic compatibility
  • Remote sensing
  • Statistical analysis
  • Stochastic reduced order models

ASJC Scopus subject areas

  • Aerospace Engineering
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

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