Effects of target bias voltage on indium tin oxide films deposited by high target utilisation sputtering

Sonya Calnan, Hari Upadhyaya, Sandra E Dann, Mike J Thwaites, Ayodhya N Tiwari

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Indium tin oxide (ITO) films were deposited by reactive High Target Utilisation Sputtering (HiTUS) onto glass and polyimide substrates. The ion plasma was generated by an RF power source while the target bias voltage was varied from 300 V to 500 V using a separate DC power supply. The deposition rate, at constant target power, increased with DC target voltage due to increased ion energy reaching 34 nm/min at 500 V All the films were polycrystalline and showed strong (400) and (222) reflections with the relative strength of latter increasing with target bias voltage. The resistivitv was lowest at 500 V with values of 1.8 x 10(-4) Omega cm and 2.4 x 10(-4) Omega cm on glass and polyimide, respectively but was still less than 5 x 10(-4) Q cm at 400 V. All films were highly transparent to visible light, (> 80%) but the NIR transmittance decreased with increasing target voltage due to higher free carrier absorption. Therefore, ITO films can be deposited onto semiconductor layers such as in solar cells, with minimal ion damage while maintaining low resistivity. (c) 2007 Elsevier B.V. All rights reserved.

Original languageEnglish
Pages (from-to)8500-8504
Number of pages5
JournalThin Solid Films
Volume515
Issue number24
DOIs
Publication statusPublished - 15 Oct 2007

Cite this