INIS
thin films
100%
irradiation
100%
cadmium tellurides
100%
MeV range
100%
oxygen ions
100%
ion beams
100%
peaks
37%
films
37%
surfaces
25%
ions
25%
spectra
12%
roughness
12%
x-ray diffraction
12%
optical properties
12%
oxygen
12%
energy gap
12%
topography
12%
photoluminescence
12%
polycrystals
12%
orientation
12%
residual stresses
12%
xrd
12%
defects
12%
grain size
12%
recrystallization
12%
Engineering
Cdte Thin
100%
Oxygen Ion
100%
Beam Irradiation
100%
Thin Films
100%
Significant Change
50%
Residual Stress
50%
X-Ray Diffraction Analysis
50%
Structure Surface
50%
Band Gap Energy
50%
Defects
50%
Energy Gap
50%
Crystallite
50%
Surface Topography
50%
Polycrystalline
50%
Material Science
Film
100%
Thin Films
100%
Structure (Composition)
33%
Surface Roughness
33%
Surface Topography
33%
Photoluminescence
33%
X Ray Diffraction Analysis
33%
X-Ray Diffraction
33%
Grain Size
33%
Residual Stress
33%
Optical Property
33%
Crystallite
33%