Dynamic Measurements at up to 130-kHz Sampling Rates Using Ti:sapphire Dual-Comb Distance Metrology

Toby Mitchell*, Jinghua Sun, Derryck T. Reid

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

By using band-limited detection we demonstrate Ti:sapphire dual-comb distance metrology at >100 kHz, providing few-nm precision in 100 ms with a non-ambiguity range of 29 cm. Exemplar dynamic measurements of audio waveforms are presented.

Original languageEnglish
Title of host publicationCLEO: Science and Innovations 2022
PublisherOPTICA Publishing Group
ISBN (Electronic)9781957171050
DOIs
Publication statusPublished - 2022
EventCLEO: Science and Innovations 2022 - San Jose, California, San Jose, United States
Duration: 15 May 202220 May 2022

Conference

ConferenceCLEO: Science and Innovations 2022
Country/TerritoryUnited States
CitySan Jose
Period15/05/2220/05/22

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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