Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

P. Rauter; T. Fromherz; G. Bauer; N. Q. Vinh; P. J. Phillips; C. R. Pidgeon; B. N. Murdin; L. Diehl; G. Dehlinger; D. Grützmacher

Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

P. Rauter
, T. Fromherz
, G. Bauer
, N. Q. Vinh
, P. J. Phillips
, C. R. Pidgeon
, B. N. Murdin
, L. Diehl
, G. Dehlinger
, D. Grützmacher

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume	2006
Publication status	Published - 2006
Event	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States Duration: 15 May 2006 → 17 May 2006

Conference

Conference	Third International SiGe Technology and Device Meeting, ISTDM 2006
Country/Territory	United States
City	Princeton, NJ
Period	15/05/06 → 17/05/06

Cite this

@inproceedings{8be8da71d3a4442fa032cf06887e6db7,

title = "Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures",

author = "P. Rauter and T. Fromherz and G. Bauer and Vinh, \{N. Q.\} and Phillips, \{P. J.\} and Pidgeon, \{C. R.\} and Murdin, \{B. N.\} and L. Diehl and G. Dehlinger and D. Gr{\"u}tzmacher",

year = "2006",

language = "English",

isbn = "1424404614",

volume = "2006",

booktitle = "Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest",

note = "Third International SiGe Technology and Device Meeting, ISTDM 2006 ; Conference date: 15-05-2006 Through 17-05-2006",

}

Rauter, P, Fromherz, T, Bauer, G, Vinh, NQ, Phillips, PJ, Pidgeon, CR, Murdin, BN, Diehl, L, Dehlinger, G & Grützmacher, D 2006, Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures. in Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. vol. 2006, Third International SiGe Technology and Device Meeting, ISTDM 2006, Princeton, NJ, United States, 15/05/06.

TY - GEN

T1 - Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

AU - Rauter, P.

AU - Fromherz, T.

AU - Bauer, G.

AU - Vinh, N. Q.

AU - Phillips, P. J.

AU - Pidgeon, C. R.

AU - Murdin, B. N.

AU - Diehl, L.

AU - Dehlinger, G.

AU - Grützmacher, D.

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/34247521462

M3 - Conference contribution

SN - 1424404614

SN - 9781424404612

VL - 2006

BT - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

T2 - Third International SiGe Technology and Device Meeting, ISTDM 2006

Y2 - 15 May 2006 through 17 May 2006

ER -

Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

Conference

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