Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

P. Rauter, T. Fromherz, G. Bauer, N. Q. Vinh, P. J. Phillips, C. R. Pidgeon, B. N. Murdin, L. Diehl, G. Dehlinger, D. Grützmacher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThird International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume2006
Publication statusPublished - 2006
EventThird International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States
Duration: 15 May 200617 May 2006

Conference

ConferenceThird International SiGe Technology and Device Meeting, ISTDM 2006
CountryUnited States
CityPrinceton, NJ
Period15/05/0617/05/06

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