Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

P. Rauter; T. Fromherz; G. Bauer; N. Q. Vinh; P. J. Phillips; C. R. Pidgeon; B. N. Murdin; L. Diehl; G. Dehlinger; D. Grützmacher

Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

P. Rauter, T. Fromherz, G. Bauer, N. Q. Vinh, P. J. Phillips, C. R. Pidgeon, B. N. Murdin, L. Diehl, G. Dehlinger, D. Grützmacher

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume	2006
Publication status	Published - 2006
Event	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States Duration: 15 May 2006 → 17 May 2006

Conference

Conference	Third International SiGe Technology and Device Meeting, ISTDM 2006
Country/Territory	United States
City	Princeton, NJ
Period	15/05/06 → 17/05/06

Cite this

@inproceedings{8be8da71d3a4442fa032cf06887e6db7,

title = "Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures",

author = "P. Rauter and T. Fromherz and G. Bauer and Vinh, {N. Q.} and Phillips, {P. J.} and Pidgeon, {C. R.} and Murdin, {B. N.} and L. Diehl and G. Dehlinger and D. Gr{\"u}tzmacher",

year = "2006",

language = "English",

isbn = "1424404614",

volume = "2006",

booktitle = "Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest",

note = "Third International SiGe Technology and Device Meeting, ISTDM 2006 ; Conference date: 15-05-2006 Through 17-05-2006",

}

Rauter, P, Fromherz, T, Bauer, G, Vinh, NQ, Phillips, PJ, Pidgeon, CR, Murdin, BN, Diehl, L, Dehlinger, G & Grützmacher, D 2006, Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures. in Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. vol. 2006, Third International SiGe Technology and Device Meeting, ISTDM 2006, Princeton, NJ, United States, 15/05/06.

TY - GEN

T1 - Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

AU - Rauter, P.

AU - Fromherz, T.

AU - Bauer, G.

AU - Vinh, N. Q.

AU - Phillips, P. J.

AU - Pidgeon, C. R.

AU - Murdin, B. N.

AU - Diehl, L.

AU - Dehlinger, G.

AU - Grützmacher, D.

PY - 2006

Y1 - 2006

UR - http://www.scopus.com/inward/record.url?scp=34247521462&partnerID=8YFLogxK

M3 - Conference contribution

SN - 1424404614

SN - 9781424404612

VL - 2006

BT - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

T2 - Third International SiGe Technology and Device Meeting, ISTDM 2006

Y2 - 15 May 2006 through 17 May 2006

ER -

Direct measurement of HH2-HH1 intersubband lifetimes in SiGe quantum cascade structures

Conference

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