Direct measurement of cross-phase modulation in microresonators

George N. Ghalanos, Jonathan M. Silver, Leonardo Del Bino, Niall P. Moroney, Michael T. M. Woodley, Andreas Svela, Shuangyou Zhang, Pascal Del'Haye

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counterpropagating light in microresonators [3-5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift.

Original languageEnglish
Title of host publicationEuropean Quantum Electronics Conference 2019
PublisherOSA Publishing
ISBN (Electronic)9781557528209
Publication statusPublished - 23 Jun 2019
EventEuropean Quantum Electronics Conference 2019 - Munich, Germany
Duration: 23 Jun 201927 Jun 2019


ConferenceEuropean Quantum Electronics Conference 2019
Abbreviated titleEQEC 2019

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


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