Direct determination of Shockley-Read-Hall trap density in InSb/InAlSb detectors

Graeme John Nott, P. C. Findlay, John Graham Crowder, Carl R Pidgeon, C. T. Elliott, T Ashley, A D Johnson, J-P R Wells, I V Bradley, B. N. Murdin, A M White

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Abstract

Accurate determination of trap density in the active region of mid-infrared narrow-bandgap detectors is crucial in the development towards background-limited performance at higher operating temperatures. We have used both optical and electrical measurements to determine the trap density in InSb/InAlSb nonequilibrium detector structures. Both of these techniques result in very good agreement with trap densities of 5×1014 cm-3.

Original languageEnglish
Pages (from-to)L731-L734
Number of pages4
JournalJournal of Physics: Condensed Matter
Volume12
Issue number50
DOIs
Publication statusPublished - 18 Dec 2000

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    Nott, G. J., Findlay, P. C., Crowder, J. G., Pidgeon, C. R., Elliott, C. T., Ashley, T., Johnson, A. D., Wells, J-P. R., Bradley, I. V., Murdin, B. N., & White, A. M. (2000). Direct determination of Shockley-Read-Hall trap density in InSb/InAlSb detectors. Journal of Physics: Condensed Matter, 12(50), L731-L734. https://doi.org/10.1088/0953-8984/12/50/101