Development of optical techniques for noncontact inspection of Y-TZP parts

Mateusz Matysiak; Jonathan P. Parry; J. Graham Crowder; Duncan P. Hand; Jonathan D. Shephard; Nick Jones; Kevyn Jonas; Nick Weston

doi:10.1111/j.1744-7402.2009.02418.x

Development of optical techniques for noncontact inspection of Y-TZP parts

Mateusz Matysiak, Jonathan P. Parry, J. Graham Crowder, Duncan P. Hand, Jonathan D. Shephard, Nick Jones, Kevyn Jonas, Nick Weston

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

A novel mid-infrared transmission imaging (MIR-TI) technique for the nondestructive, optical inspection of yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) components is described. This technique was designed specifically for the detection of flaws and cracks within the bulk of the ceramic component. The MIR-TI technique exploits a transparency window in Y-TZP from 3 to 7 µm; at shorter wavelengths the material is highly scattering, while at longer wavelengths it is absorbing. We demonstrate that using this technique it is possible to detect micrometer-scale flaws at depths of up to 6 mm. © 2009 The American Ceramic Society.

Original language	English
Pages (from-to)	140-151
Number of pages	12
Journal	International Journal of Applied Ceramic Technology
Volume	8
Issue number	1
DOIs	https://doi.org/10.1111/j.1744-7402.2009.02418.x
Publication status	Published - Jan 2011

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10.1111/j.1744-7402.2009.02418.x

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title = "Development of optical techniques for noncontact inspection of Y-TZP parts",

abstract = "A novel mid-infrared transmission imaging (MIR-TI) technique for the nondestructive, optical inspection of yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) components is described. This technique was designed specifically for the detection of flaws and cracks within the bulk of the ceramic component. The MIR-TI technique exploits a transparency window in Y-TZP from 3 to 7 µm; at shorter wavelengths the material is highly scattering, while at longer wavelengths it is absorbing. We demonstrate that using this technique it is possible to detect micrometer-scale flaws at depths of up to 6 mm. {\textcopyright} 2009 The American Ceramic Society.",

author = "Mateusz Matysiak and Parry, \{Jonathan P.\} and Crowder, \{J. Graham\} and Hand, \{Duncan P.\} and Shephard, \{Jonathan D.\} and Nick Jones and Kevyn Jonas and Nick Weston",

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AU - Matysiak, Mateusz

AU - Parry, Jonathan P.

AU - Crowder, J. Graham

AU - Hand, Duncan P.

AU - Shephard, Jonathan D.

AU - Jones, Nick

AU - Jonas, Kevyn

AU - Weston, Nick

PY - 2011/1

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AB - A novel mid-infrared transmission imaging (MIR-TI) technique for the nondestructive, optical inspection of yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) components is described. This technique was designed specifically for the detection of flaws and cracks within the bulk of the ceramic component. The MIR-TI technique exploits a transparency window in Y-TZP from 3 to 7 µm; at shorter wavelengths the material is highly scattering, while at longer wavelengths it is absorbing. We demonstrate that using this technique it is possible to detect micrometer-scale flaws at depths of up to 6 mm. © 2009 The American Ceramic Society.

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EP - 151

JO - International Journal of Applied Ceramic Technology

JF - International Journal of Applied Ceramic Technology

IS - 1

ER -

Development of optical techniques for noncontact inspection of Y-TZP parts

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