Determination of the optical transfer matrix for the sinusoidal grating pattern

Jianlin Nie*, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, Wei Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

As a new type of imaging technology, polarization imaging technology not only has a great future within target detection, but also has unique applications in machine vision. As a natural extension to the well-known Optical Transfer Function for scalar imaging systems, we proposed a new concept referred to as Optical Transfer Matrix (OTM) to analyze the performance of polarization imaging systems. The approach of OTM describes the frequency transfer characteristic of the system for the Stokes parameters between the object plane and the image plane, revealing some distinct advantages. In this paper, we modulate the spatial frequency of the light source by means of sinusoidal grating patterns and calculate the OTM from the resulting images. We evaluate the performance of polarization imaging systems by analyzing the OTM. This provides technical support for the subsequent research on OTM.

Original languageEnglish
Title of host publicationSpeckle 2023
Subtitle of host publicationVIII International Conference on Speckle Metrology
EditorsWeiguo Liu, Wei Wang, Yechuan Zhu
PublisherSPIE
ISBN (Electronic)9781510674592
ISBN (Print)9781510674585
DOIs
Publication statusPublished - 4 Mar 2024
Event8th International Conference on Speckle Metrology 2023 - Xi'an, China
Duration: 18 Oct 202320 Oct 2023

Publication series

NameProceedings of SPIE
Volume13070
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference8th International Conference on Speckle Metrology 2023
Abbreviated titleSpeckle 2023
Country/TerritoryChina
CityXi'an
Period18/10/2320/10/23

Keywords

  • Optical Transfer Matrix
  • polarizing elements
  • sinusoidal grating pattern

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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