Determination of the lattice constant of CrS from Mn1-xCr xS MBE epitaxial layers

L. David, K. A. Prior

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A series of Mn1-xCrxS epitaxial structures have been grown with the composition ZnSe/Mn1-xCrxS/ZnSe with varying x. X-ray Interference measurements were used to determine the layer thicknesses and compositions, and by varying the lattice parameter of CrS an improved fit was obtained. The lattice parameter of CrS was found to be 5.387 ± 0.025 Å. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.

Original languageEnglish
Pages (from-to)778-781
Number of pages4
JournalPhysica Status Solidi B - Basic Research
Volume243
Issue number4
DOIs
Publication statusPublished - Mar 2006

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