Abstract
A series of Mn1-xCrxS epitaxial structures have been grown with the composition ZnSe/Mn1-xCrxS/ZnSe with varying x. X-ray Interference measurements were used to determine the layer thicknesses and compositions, and by varying the lattice parameter of CrS an improved fit was obtained. The lattice parameter of CrS was found to be 5.387 ± 0.025 Å. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.
Original language | English |
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Pages (from-to) | 778-781 |
Number of pages | 4 |
Journal | Physica Status Solidi B - Basic Research |
Volume | 243 |
Issue number | 4 |
DOIs | |
Publication status | Published - Mar 2006 |