The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, n2 value of 1.40×10−13m2W−1. The obtained value is similar to the n2 value of monolayer MoS2 film measured at 2.0μm, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large n2 indicates that MoS2 can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550nm optical telecommunications wavelength band.
|Journal of Nonlinear Optical Physics and Materials
|Early online date
|13 May 2023
|E-pub ahead of print - 13 May 2023
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy (miscellaneous)