Determination of nonlinear refractive index of large area monolayer MoS2 at telecommunication wavelength using time-resolved Z-scan technique

Jing Wen Chew; Wu Yi Chong; Sithi Vinayakam Muniandy; Yuen Kiat Yap; Harith Ahmad

doi:10.1142/S0218863523500522

Determination of nonlinear refractive index of large area monolayer MoS₂ at telecommunication wavelength using time-resolved Z-scan technique

Jing Wen Chew, Wu Yi Chong, Sithi Vinayakam Muniandy, Yuen Kiat Yap, Harith Ahmad

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Abstract

The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS₂) thin film at the 1,550nm wavelength band is determined using time-resolved z-scan technique. MoS₂ exhibits positive nonlinear phase shift with a large nonlinear refractive index, n₂ value of 1.40×10−¹³m²W⁻¹. The obtained value is similar to the n₂ value of monolayer MoS₂ film measured at 2.0μm, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large n₂ indicates that MoS₂ can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550nm optical telecommunications wavelength band.

Original language	English
Article number	2350052
Journal	Journal of Nonlinear Optical Physics and Materials
Volume	33
Issue number	5
Early online date	13 May 2023
DOIs	https://doi.org/10.1142/S0218863523500522
Publication status	Published - Oct 2024

Keywords

Nonlinear refractive index
Z-scan
molybdenum disulfide
telecommunication wavelength

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Physics and Astronomy (miscellaneous)

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10.1142/S0218863523500522

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This is an Accepted Manuscript of an article published by World Scientific Publishing in Journal of Nonlinear Optical Physics and Materials, available online in final form: https://doi.org/10.1142/S0218863523500522
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Cite this

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title = "Determination of nonlinear refractive index of large area monolayer MoS2 at telecommunication wavelength using time-resolved Z-scan technique",

abstract = "The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, n2 value of 1.40×10−13m2W−1. The obtained value is similar to the n2 value of monolayer MoS2 film measured at 2.0μm, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large n2 indicates that MoS2 can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550nm optical telecommunications wavelength band.",

keywords = "Nonlinear refractive index, Z-scan, molybdenum disulfide, telecommunication wavelength",

author = "Chew, {Jing Wen} and Chong, {Wu Yi} and Muniandy, {Sithi Vinayakam} and Yap, {Yuen Kiat} and Harith Ahmad",

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AU - Ahmad, Harith

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AB - The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, n2 value of 1.40×10−13m2W−1. The obtained value is similar to the n2 value of monolayer MoS2 film measured at 2.0μm, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large n2 indicates that MoS2 can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550nm optical telecommunications wavelength band.

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