Determination of interface structure and bonding by Z-contrast STEM

S J Pennycook, N D Browning, M M McGibbon, A J McGibbon, M F Chisholm, David Jesson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of Gettering and Defect Engineering in Semiconductor Technology, Wulkow/Neuhardenberg, Germany, September 1995, Solid State Phenomena
Pages561
Number of pages1
Volume47-48
Publication statusPublished - 1996

Cite this

Pennycook, S. J., Browning, N. D., McGibbon, M. M., McGibbon, A. J., Chisholm, M. F., & Jesson, D. (1996). Determination of interface structure and bonding by Z-contrast STEM. In Proceedings of Gettering and Defect Engineering in Semiconductor Technology, Wulkow/Neuhardenberg, Germany, September 1995, Solid State Phenomena (Vol. 47-48, pp. 561)