Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures

T Wan; G A V Leaf; C Iype

Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures

T Wan
, G A V Leaf
, C Iype

School of Textiles & Design

Research output: Contribution to conference › Paper

Original language	English
Pages	pp90-94
Number of pages	5
Publication status	Published - 1996
Event	Discrete Events and Manufacturing System, Computational Engineering in System Applications - Duration: 1 Jan 1996 → …

Conference

Conference	Discrete Events and Manufacturing System, Computational Engineering in System Applications
Abbreviated title	CESA '96 IMACS-IEEE/SMC
Period	1/01/96 → …

Cite this

@conference{e075a6cd85c143d89e88768e55e49683,

title = "Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures",

author = "T Wan and Leaf, \{G A V\} and C Iype",

year = "1996",

language = "English",

pages = "pp90--94",

note = "Discrete Events and Manufacturing System, Computational Engineering in System Applications, CESA '96 IMACS-IEEE/SMC ; Conference date: 01-01-1996",

}

Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures. / Wan, T; Leaf, G A V; Iype, C.
1996. pp90-94 Paper presented at Discrete Events and Manufacturing System, Computational Engineering in System Applications.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures

AU - Wan, T

AU - Leaf, G A V

AU - Iype, C

PY - 1996

Y1 - 1996

M3 - Paper

SP - 90

EP - 94

T2 - Discrete Events and Manufacturing System, Computational Engineering in System Applications

Y2 - 1 January 1996

ER -