Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures

T Wan, G A V Leaf, C Iype

Research output: Contribution to conferencePaper

Original languageEnglish
Pagespp90-94
Number of pages5
Publication statusPublished - 1996
EventDiscrete Events and Manufacturing System, Computational Engineering in System Applications -
Duration: 1 Jan 1996 → …

Conference

ConferenceDiscrete Events and Manufacturing System, Computational Engineering in System Applications
Abbreviated titleCESA '96 IMACS-IEEE/SMC
Period1/01/96 → …

Cite this

Wan, T., Leaf, G. A. V., & Iype, C. (1996). Detection and Analysis of Nep-like Structures by Image Processing Methods: A New Objective Measurement System for Identifying and Analysing Nep-like Structures in Top Manufactures. pp90-94. Paper presented at Discrete Events and Manufacturing System, Computational Engineering in System Applications, .