Abstract
Ge-on-Si single-photon detectors are fabricated and characterized at 1310 and 1550 nm. 4 % single-photon detection efficiency is observed at 1310 nm demonstrating the lowest reported noise equivalent power for Ge-on-Si single-photon detectors (1×10-14 WHz-1/2).
| Original language | English |
|---|---|
| Title of host publication | IEEE International Conference on Group IV Photonics GFP |
| Publisher | IEEE |
| Pages | 132-133 |
| Number of pages | 2 |
| ISBN (Print) | 978-1-4673-5803-3 |
| DOIs | |
| Publication status | Published - 31 Dec 2013 |
| Event | 2013 IEEE 10th International Conference on Group IV Photonics - Seoul, Korea, Republic of Duration: 28 Aug 2013 → 30 Aug 2013 |
Conference
| Conference | 2013 IEEE 10th International Conference on Group IV Photonics |
|---|---|
| Abbreviated title | GFP 2013 |
| Country/Territory | Korea, Republic of |
| City | Seoul |
| Period | 28/08/13 → 30/08/13 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Ceramics and Composites
- Electronic, Optical and Magnetic Materials
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