Design and performance of a prototype mesa-geometry Ge-on-Si single-photon avalanche diode detector at 1310 nm and 1550 nm wavelengths

  • G. Intermite
  • , R. E. Warburton
  • , M. Myronov
  • , P. Allred
  • , D. R. Leadley
  • , K. Gallacher
  • , D. J. Paul
  • , N. J. Pilgrim
  • , L. J M Lever
  • , Z. Ikonic
  • , R. W. Kelsall
  • , G. S. Buller

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ge-on-Si single-photon detectors are fabricated and characterized at 1310 and 1550 nm. 4 % single-photon detection efficiency is observed at 1310 nm demonstrating the lowest reported noise equivalent power for Ge-on-Si single-photon detectors (1×10-14 WHz-1/2).

Original languageEnglish
Title of host publicationIEEE International Conference on Group IV Photonics GFP
PublisherIEEE
Pages132-133
Number of pages2
ISBN (Print)978-1-4673-5803-3
DOIs
Publication statusPublished - 31 Dec 2013
Event2013 IEEE 10th International Conference on Group IV Photonics - Seoul, Korea, Republic of
Duration: 28 Aug 201330 Aug 2013

Conference

Conference2013 IEEE 10th International Conference on Group IV Photonics
Abbreviated titleGFP 2013
Country/TerritoryKorea, Republic of
CitySeoul
Period28/08/1330/08/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials

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