Decoupling the dark count rate contributions in Ge-on-Si single photon avalanche diodes

Derek C. S. Dumas, Conor Coughlan, Charlie Smith, Muhammad M. Mirza, Jarosław Kirdoda, Fiona Fleming, Charlie McCarthy, Hannah Mowbray, Xin Yi, Lisa Saalbach, Gerald Stuart Buller, Douglas J. Paul*, Ross W. Millar*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

27 Downloads (Pure)

Abstract

Single Photon Avalanche Diodes (SPADs) are semiconductor devices capable of accurately timing the arrival of single photons of light. Previously, we have demonstrated a pseudo-planar Ge-on-Si SPAD that operates in the short-wave infrared, which can be compatible with Si foundry processing. Here, we investigate the pseudo-planar design with simulation and experiment to establish the spatial contributions to the dark-count rate, which will ultimately facilitate optimisation towards operation at temperatures compatible with Peltier cooler technologies.
Original languageEnglish
Title of host publicationQuantum Sensing and Nano Electronics and Photonics XX
PublisherSPIE
ISBN (Print)9781510670501
DOIs
Publication statusPublished - 8 Mar 2024
EventQuantum Sensing and Nano Electronics and Photonics XX - San Francisco, United States
Duration: 27 Jan 20241 Feb 2024
Conference number: 20
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/PC12895.toc

Publication series

NameProceedings SPIE
PublisherSPIE
Volume12895
ISSN (Print)0277-786X

Conference

ConferenceQuantum Sensing and Nano Electronics and Photonics XX
Abbreviated titleSPIE OPTO
Country/TerritoryUnited States
CitySan Francisco
Period27/01/241/02/24
Internet address

Keywords

  • Single photon avalanche diode
  • Ge-on-Si
  • device simulation
  • Si Photonics

Fingerprint

Dive into the research topics of 'Decoupling the dark count rate contributions in Ge-on-Si single photon avalanche diodes'. Together they form a unique fingerprint.

Cite this