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Data richness and reliability in smart-field management - is there value?

  • George Hayford Aggrey
  • , David Roland Davies
  • , A Ajayi
  • , M Konopczynski

    Research output: Contribution to conferencePaper

    Original languageEnglish
    Pages17 pp.
    Number of pages17
    DOIs
    Publication statusPublished - Sept 2006
    EventSPE Annual Technical Conference and Exhibition 2006 - San Antonio, Texas
    Duration: 24 Sept 200624 Sept 2006

    Conference

    ConferenceSPE Annual Technical Conference and Exhibition 2006
    CitySan Antonio, Texas
    Period24/09/0624/09/06

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