Critical thickness for nanostructure self-assembly during Stranski-Krastanow growth

David E. Jesson, Timothy P. Munt, Chaogang Lou

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Stranski-Krastanow growth is discussed in the context of a simple classical nucleation model which emphasizes the important role of the wetting layer. The model predicts a rapid transition to a 3D island phase which chiefly depends on the interaction between atoms in the wetting layer and the substrate. A simple analytical expression for the critical thickness at which the transition occurs is derived.

Original languageEnglish
Pages (from-to)7230-7231
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume43
Issue number10
DOIs
Publication statusPublished - Oct 2004

Keywords

  • Critical thickness
  • Nanostructures
  • Nucleation
  • Quantum dots
  • Stranski-Krastanow growth

Fingerprint

Dive into the research topics of 'Critical thickness for nanostructure self-assembly during Stranski-Krastanow growth'. Together they form a unique fingerprint.

Cite this