Comprehensive investigation of Ge-Si bonded interfaces using oxygen radical activation

Ki Yeol Byun*, Pete Fleming, Nick Bennett, Farzan Gity, Patrick McNally, Michael Morris, Isabelle Ferain, Cindy Colinge

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)
112 Downloads (Pure)

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Material Science