INIS
control
100%
range
100%
transport
100%
semiconductor materials
100%
defects
100%
stoichiometry
100%
data
50%
sulfur
50%
sulfides
50%
x-ray diffraction
50%
mixtures
50%
interactions
50%
tubes
50%
heating
50%
electrons
50%
magnetization
50%
antiferromagnetism
50%
squid devices
50%
solid solutions
50%
physical properties
50%
quartz
50%
thermal gravimetric analysis
50%
Engineering
Defects
100%
Semiconductor Type
100%
Low-Temperature
50%
Narrowband
50%
X-Ray Powder Diffraction
50%
Marked Increase
50%
Quartz Tube
50%
Ga Content
50%
Solid Solution
50%
Material Science
Electrical Resistivity
100%
Powder X-Ray Diffraction
100%
Physical Property
100%
Solid Solution
100%
Earth and Planetary Sciences
Magnetic Measurement
100%
Transport Property
100%
Narrowband
50%
Solid Solution
50%
Powder X-Ray Diffraction
50%
Physics
Transport Property
100%
Magnetic Measurement
100%
Solid Solutions
50%
Powder X-Ray Diffraction
50%
Narrowband
50%
Chemical Engineering
Magnetic Variables Measurement
100%
Magnetometry
100%