Abstract
The compensating acceptors and donors in nitrogen d-doped ZnSe epilayers grown by molecular beam epitaxy using a nitrogen rf-plasma source are studied by means of photoluminescence and photoluminescence excitation spectroscopy. A deep acceptor and a deep donor with ionization energies of ~ 170 and ~ 88 meV are reported for the nitrogen d-doped layers. These two deep centres are assigned to N-clusters, i.e., NSe-Zn-NSe for the deep acceptor and NSe-NZn for the deep donor.
| Original language | English |
|---|---|
| Pages (from-to) | 248-251 |
| Number of pages | 4 |
| Journal | Journal of Crystal Growth |
| Volume | 159 |
| Issue number | 1-4 |
| Publication status | Published - Feb 1996 |