Abstract
The compensating acceptors and donors in nitrogen d-doped ZnSe epilayers grown by molecular beam epitaxy using a nitrogen rf-plasma source are studied by means of photoluminescence (PL) and photoluminescence excitation spectroscopy (PLE). The temperature dependence of PL and PLE spectra obtained from the nitrogen d-doped layers is investigated in detail, and a deep acceptor and a deep donor with ionization energies of ~170 and ~88 meV are reported for the nitrogen d-doped layers. These two deep centers are assigned to N clusters, i.e., NSe-Zn-NSe for the deep acceptor and NSe-NZn for the deep donor.© 1995 American Institute of Physics.
| Original language | English |
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| Pages (from-to) | 2167-2169 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 67 |
| Issue number | 15 |
| DOIs | |
| Publication status | Published - 9 Oct 1995 |