Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface

Jonathan Swingler

doi:10.1088/0022-3727/43/14/145302

Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface

Research output: Contribution to journal › Article

Abstract

Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.

Original language	English
Article number	145302
Number of pages	6
Journal	Journal of Physics D: Applied Physics
Volume	43
Issue number	14
DOIs	https://doi.org/10.1088/0022-3727/43/14/145302
Publication status	Published - 2010

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Swingler, J. (2010). Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface. Journal of Physics D: Applied Physics, 43(14), [145302]. https://doi.org/10.1088/0022-3727/43/14/145302

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