Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface

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Abstract

Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.


Original languageEnglish
Article number145302
Number of pages6
JournalJournal of Physics D: Applied Physics
Volume43
Issue number14
DOIs
Publication statusPublished - 2010

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electric contacts
spatial distribution
fractals
lugs
pixels
peninsulas
printed circuits
circuit boards
cables
tomography
x rays

Cite this

@article{2ddd3117b6144970b0c304a7f7f08f61,
title = "Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface",
abstract = "Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.",
author = "Jonathan Swingler",
year = "2010",
doi = "10.1088/0022-3727/43/14/145302",
language = "English",
volume = "43",
journal = "Journal of Physics D: Applied Physics",
issn = "0022-3727",
publisher = "IOP Publishing",
number = "14",

}

TY - JOUR

T1 - Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface

AU - Swingler, Jonathan

PY - 2010

Y1 - 2010

N2 - Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.

AB - Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.

U2 - 10.1088/0022-3727/43/14/145302

DO - 10.1088/0022-3727/43/14/145302

M3 - Article

VL - 43

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

SN - 0022-3727

IS - 14

M1 - 145302

ER -