Clustering and the spatial distribution of contact spots at a real un-dismantled electrical contact interface

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Abstract

Contact maps of an electrical interface are acquired using an x-ray computer tomography technique without the need for dismantling the specimens. These maps consist of approximately 1500 × 1500 pixels with each pixel relating to an 8.0 µm by 8.0 µm by 8.0 µm volume at the interface. The specimens consist of a cable lug bolted to a printed circuit board at various contact normal forces of between 0.8 and 3.2 kN. The contact maps reveal a complex network of contacting 'islands' with meandering perimeters consisting of contacting 'peninsulas' and non-contacting 'fjords'. The fractal characteristics of the spot spatial distribution show similar behaviour to the fractal characteristics of the spot size distribution.


Original languageEnglish
Article number145302
Number of pages6
JournalJournal of Physics D: Applied Physics
Volume43
Issue number14
DOIs
Publication statusPublished - 2010

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