Chain length dependent polymorphism in even number n-alkanes: Line profile analysis of synchrotron powder X-ray diffraction data

S. R. Craig, G. P. Hastie, K. J. Roberts

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)
Original languageEnglish
Pages (from-to)1193-1196
Number of pages4
JournalJournal of Materials Science Letters
Issue number14
Publication statusPublished - 15 Jul 1996

Cite this