Chain length dependent polymorphism in even number n-alkanes: Line profile analysis of synchrotron powder X-ray diffraction data

S. R. Craig, G. P. Hastie, K. J. Roberts

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1193-1196
Number of pages	4
Journal	Journal of Materials Science Letters
Volume	15
Issue number	14
Publication status	Published - 15 Jul 1996

Cite this

@article{4e6cfce04c874acd9950b8bac998b3e5,

title = "Chain length dependent polymorphism in even number n-alkanes: Line profile analysis of synchrotron powder X-ray diffraction data",

author = "Craig, {S. R.} and Hastie, {G. P.} and Roberts, {K. J.}",

year = "1996",

month = jul,

day = "15",

language = "English",

volume = "15",

pages = "1193--1196",

journal = "Journal of Materials Science Letters",

issn = "1573-4811",

publisher = "Chapman & Hall",

number = "14",

}

TY - JOUR

T1 - Chain length dependent polymorphism in even number n-alkanes

T2 - Line profile analysis of synchrotron powder X-ray diffraction data

AU - Craig, S. R.

AU - Hastie, G. P.

AU - Roberts, K. J.

PY - 1996/7/15

Y1 - 1996/7/15

M3 - Article

SN - 1573-4811

VL - 15

SP - 1193

EP - 1196

JO - Journal of Materials Science Letters

JF - Journal of Materials Science Letters

IS - 14

ER -