Chain length dependant polymorphism in even numbered n-alkanes : line profile analysis of synchrotron radiation powder X-ray diffraction data.

S R Craig; G P Hastie; K J Roberts

Chain length dependant polymorphism in even numbered n-alkanes : line profile analysis of synchrotron radiation powder X-ray diffraction data.

S R Craig, G P Hastie, K J Roberts

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	1193-1196
Number of pages	4
Journal	Journal of Materials Science Letters
Volume	15
Publication status	Published - 1996

Cite this

@article{e87b7a99c5604177b2292cf90f108725,

title = "Chain length dependant polymorphism in even numbered n-alkanes : line profile analysis of synchrotron radiation powder X-ray diffraction data.",

author = "Craig, {S R} and Hastie, {G P} and Roberts, {K J}",

year = "1996",

language = "English",

volume = "15",

pages = "1193--1196",

journal = "Journal of Materials Science Letters",

issn = "0261-8028",

publisher = "Chapman & Hall",

}

TY - JOUR

T1 - Chain length dependant polymorphism in even numbered n-alkanes : line profile analysis of synchrotron radiation powder X-ray diffraction data.

AU - Craig, S R

AU - Hastie, G P

AU - Roberts, K J

PY - 1996

Y1 - 1996

M3 - Article

SN - 0261-8028

VL - 15

SP - 1193

EP - 1196

JO - Journal of Materials Science Letters

JF - Journal of Materials Science Letters

ER -