Abstract
Powder X-ray diffraction data suggested that materials VxCr3-xS4 (1.0<x<3.0) adopt the Cr3S4-type structure. However, a small number of additional weak peaks indicated the presence of a second phase. This could not be identified from X-ray data owing to the very low intensities of the additional reflections. However, the appreciable intensity of the corresponding reflections in powder neutron diffraction patterns led to these being indexed on the basis of a rhombohedral unit-cell and identification of the second phase as V2O3. Two-phase structural refinement, by the Rietveld method, using neutron and X-ray data simultaneously, revealed that the ternary phase, although of the Cr3S4-type, is cation deficient. Additional cation vacancies are confined to the ordered-vacancy layer.
Original language | English |
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Pages (from-to) | 686-691 |
Number of pages | 6 |
Journal | Materials Science Forum |
Volume | 278-281 |
Issue number | PART 2 |
Publication status | Published - 1998 |
Keywords
- Neutron Diffraction
- Quantitative Analysis
- Rietveld Analysis
- Ternary Sulfides
- X-Ray Diffraction