CARRIER ESCAPE DYNAMICS IN A SINGLE-QUANTUM-WELL WAVE-GUIDE MODULATOR

R BAMBHA, D C HUTCHINGS, M J SNELLING, P LIKAMWA, A MILLER, A L MORETTI, R W WICKMAN, K A STAIR, T E BIRD, J A CAVAILLES, D A B MILLER

Research output: Contribution to journalArticle

Abstract

Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.

Original languageEnglish
Pages (from-to)S965-S971
Number of pages7
JournalOptical and Quantum Electronics
Volume25
Issue number12
Publication statusPublished - Dec 1993

Cite this

BAMBHA, R., HUTCHINGS, D. C., SNELLING, M. J., LIKAMWA, P., MILLER, A., MORETTI, A. L., WICKMAN, R. W., STAIR, K. A., BIRD, T. E., CAVAILLES, J. A., & MILLER, D. A. B. (1993). CARRIER ESCAPE DYNAMICS IN A SINGLE-QUANTUM-WELL WAVE-GUIDE MODULATOR. Optical and Quantum Electronics, 25(12), S965-S971.