Skip to main navigation Skip to search Skip to main content

Calibration of an optical fluorescence method for film thickness measurement

  • Anita C Jones
  • , M. Millington
  • , J. Muhl
  • , J. M. De Freitas
  • , James S Barton
  • , G. Gregory

Research output: Contribution to journalArticlepeer-review

Abstract

We describe the calibration of a technique allowing quantitative measurements of industrial coatings with thicknesses as small as 10-20 nm. Wax films doped with fluorescent rhodamine dye have been deposited by an electrospray method onto an optically flat surface of aluminium-coated glass. The films were of 220-450 nm peak thickness, which we measured with an optical profilometer using laser triangulation. Possession of a set of films allowing an absolute calibration of the fluorescence intensity versus thickness to be achieved for application in trials of the fluorescence method for measuring coating thicknesses of 10-20 nm under industrial process conditions.

Original languageEnglish
Pages (from-to)N23-N27
Number of pages5
JournalMeasurement Science and Technology
Volume12
Issue number5
DOIs
Publication statusPublished - May 2001

Fingerprint

Dive into the research topics of 'Calibration of an optical fluorescence method for film thickness measurement'. Together they form a unique fingerprint.

Cite this